IR Spectral Ellipsometry

IR Spectral Ellipsometer

The device is designed to determine the thickness of thin films and multilayer heterostructures, determine the refractive index and absorption in the infrared range, study the physicochemical properties of dielectric, semiconductor, polymer and metal structures.

Key features and capabilities:

ellipsometry with a rotating compensator;

spectral range from 2 to 33 microns (300 to 5000 cm -1);

spectral resolution: from 1 to 64 cm-1;

angle of incidence: from 30 ° to 90 ° (± 0.005 °);

measurement time: from 1 to 30 minutes (1 angle at a resolution of 16 cm-1);

non-destructive analysis.

The Bauman University will launch contract production of quantum processors

The goal is to meet the growing need in the Russian Federation for next generation supercomputers

“Russia is building a quantum world”: FMN Lab winning in the all-Russian photo competition

A photograph by BMSTU photographer Sergei Kushlevich among the best works at VDNH expo

Anastasia Solovyova and Dmitry Moskalev are laureates of the Moscow Government Prize for Young Scientists

Achievements in the development of quantum information processing devices were noted

Bauman DeepTech Expert Council was held at BMSTU

FMN Lab team shared the results of the implementation of projects on the “Hybrid Computing”

FMN Lab team participated in the “AnalitBioPribor 2023” conference

A team of bionanotechnologists part in the II Annual All-Russian Youth Conference on methods and instruments for the analysis of biological objects “AnalyBioPribor 2023”.