Бауманка запустит контрактное производство квантовых процессоров
Серия обеспечит растущую потребность РФ в суперкомпьютерах следующего поколения
Spectroscopic scanning reflectometer
The setup is designed to control the thickness of single-layer and multi-layer coatings, determine the optical constants of single-layer and multi-layer coatings in the wavelength range from 430 to 930 nm, and to control the uniformity of thickness of the analyzed coating.
Key features and capabilities: